In situ AFM Observation of Growth of Anodic Oxide Films on Aluminum -Mechanism for Flattening of the Film Surface-

摘要

Two kinds of aluminum specimens were prepared: 1) chemically polished specimen (CP-specimen) and 2) surface-roughened specimen (PD-specimen) obtained by removing a porous anodic oxide film through dissolution in an H_3PO_4/CrO_3 solution. The change in the surface roughness of CP-and PD-specimens during anodizing in a neutral solution was monitored with in site atomic force microscopoy (AFM) and transmission electron microscoopy (TEM) as a function of anode potential.