Detailed modeling and reliability analysis of fault-tolerant processor arrays

摘要

A method for the generation of detailed models of fault-tolerant processor arrays, based on stochastic Petri nets (SPNs), is presented. A compact SPN model of the array associates with each transition a set of attributes that includes a discrete probability distribution. Depending on the type of component and the reconfiguration scheme, these probabilities are determined using simulation or closed-form expressions and correspond to the survival of the array given that a number of components required by the reconfiguration process are faulty.