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DRAM-Latency Optimization Inspired by Relationship between Row-Access Time and Refresh Timing

机译:行访问时间与刷新定时之间的关系启发了DRAM延迟优化

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摘要

It is widely known that relatively long DRAM latency forms a bottleneck in computing systems. However, DRAM vendors are strongly reluctant to decrease DRAM latency due to the additional manufacturing cost. Therefore, we set our goal to reduce DRAM latency without any modification in the existing DRAM structure. To accomplish our goal, we focus on an intrinsic phenomenon in DRAM: electric charge variation in DRAM cell capacitors. Then, we draw two key insights: i) DRAM row-access latency of a row is a function of the elapsed time from when the row was last refreshed, and ii) DRAM row-access latency of a row is also a function of the remaining time until the row is next refreshed. Based on these two insights, we propose two mechanisms to reduce DRAM latency: NUAT-1 and NUAT-2. NUAT-1 exploits the first key insight and NUAT-2 exploits the second key insight. For evaluation, circuit- and system-level simulations are performed, which show the performance improvement for various environments.
机译:众所周知,较长的DRAM延迟形成了计算系统的瓶颈。但是,由于额外的制造成本,DRAM供应商强烈不愿减少DRAM延迟。因此,我们设定了在不对现有DRAM结构进行任何修改的情况下减少DRAM延迟的目标。为了实现我们的目标,我们关注DRAM中的一种固有现象:DRAM单元电容器中的电荷变化。然后,我们得出两个主要见解:i)行的DRAM行访问等待时间是自上次刷新该行以来经过的时间的函数,并且ii)行的DRAM行访问等待时间也是该行的函数直到下一次刷新该行为止的剩余时间。基于这两种见解,我们提出了两种减少DRAM延迟的机制:NUAT-1和NUAT-2。 NUAT-1利用第一个关键洞察力,而NUAT-2利用第二个关键洞察力。为了进行评估,执行了电路级和系统级仿真,这些仿真显示了各种环境下的性能提高。

著录项

  • 来源
    《IEEE Transactions on Computers》 |2016年第10期|3027-3040|共14页
  • 作者单位

    Department of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, South Korea;

    Department of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, South Korea;

    Department of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, South Korea;

    Department of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, South Korea;

    DRAM Development Division, SK hynix, Icheon, South Korea;

    DRAM Development Division, SK hynix, Icheon, South Korea;

    Department of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, South Korea;

  • 收录信息
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    Random access memory; Sensors; Timing; Capacitors; Transistors; Storage tanks; Decoding;

    机译:随机存取存储器;传感器;定时;电容器;晶体管;储罐;解码;
  • 入库时间 2022-08-17 13:36:10

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