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Non-volatile run-time field-programmable gate arrays structures using thermally assisted switching magnetic random access memories

机译:使用热辅助开关磁性随机存取存储器的非易失性运行时现场可编程门阵列结构

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This study describes the integration of thermally assisted switching magnetic random access memories (TAS-MRAMs) in field-programmable gate array (FPGA) design. The non-volatility is achieved through the use of magnetic tunnelling junctions (MTJs) in an MRAM cell. A TAS scheme is used to write data in the MTJ device, which helps to reduce power consumption during a write operation in comparison with the conventional writing scheme used in MTJ devices. Furthermore, the non-volatility allows reducing both power consumption and configuration time required at each power-up of the circuit in comparison with classical static random access memory-based FPGAs. An innovative architecture furthermore provides run-time reconfigurable (RTR) support at minimum area overhead. A RTR FPGA element using TAS-MRAM allows dynamic reconfiguration mechanisms, while featuring simple design architecture.
机译:这项研究描述了在现场可编程门阵列(FPGA)设计中热辅助开关磁性随机存取存储器(TAS-MRAM)的集成。非易失性是通过在MRAM单元中使用磁隧道结(MTJ)来实现的。 TAS方案用于在MTJ器件中写入数据,与MTJ器件中使用的传统写入方案相比,它有助于减少写入操作期间的功耗。此外,与传统的基于静态随机存取存储器的FPGA相比,非易失性可以减少电路每次上电时的功耗和配置时间。此外,创新的体系结构还以最小的区域开销提供了运行时可重新配置(RTR)支持。使用TAS-MRAM的RTR FPGA元件允许动态重新配置机制,同时具有简单的设计架构。

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