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首页> 外文期刊>Components, Packaging and Manufacturing Technology, IEEE Transactions on >Novel Chip-Last Method for Embedded Actives in Organic Packaging Substrates
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Novel Chip-Last Method for Embedded Actives in Organic Packaging Substrates

机译:一种用于有机包装基板中嵌入活性物的最新的无芯片方法

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摘要

Embedded actives are to bury thinned active chips into package substrates, as opposed to surface mounted devices (SMDs), which can achieve smaller form factor, better electrical performance and higher functionality than the SMD technology. While many embedded actives have been explored so far, they are based on chip-first and -middle approaches, in which the active chips are embedded before and during the build-up processes of package substrates, respectively. The most concern with those two current approaches is the loss accumulation associated with the build-up layer processes carried out right on top of the embedded chips, which is highly likely to lose the embedded chips during their packaging process. The reworkability to replace the faulty chips embedded with good ones and thermal management of the embedded chips are also issues since the embedded chips are totally surrounded by hard-cured polymers. In this paper, chip-last embedded active has been proposed to address some of the issues that are reported in current chip-first and -middle approaches, in which chips are embedded after all the package substrate processes including the build-up layers are completed, just like conventional SMD packaging. In the chip-last approach, a cavity is introduced within the build-up layers of package substrate and a chip is directly embedded into the cavity. A first proto-type of the chip-last embedded active will be demonstrated by developing various cavity formation processes within the build-up layers and then embedding 100 $mu{rm m}$ thick chips into the defined cavities.
机译:与表面贴装器件(SMD)相比,嵌入式有源器件是将变薄的有源芯片埋入封装基板中,与SMD技术相比,表面贴装器件(SMD)可以实现更小尺寸,更好的电气性能和更高的功能。尽管到目前为止已经探索了许多嵌入式有源,但是它们是基于芯片优先和中间方法的,其中有源芯片分别在封装基板的构建过程之前和过程中嵌入。这两种当前方法最关注的是与在嵌入式芯片之上执行的构建层工艺相关的损耗累积,这很可能在其封装过程中丢失嵌入式芯片。由于嵌入的芯片完全被硬固化的聚合物包围,因此用良好的芯片替换有缺陷的芯片的可返工性和嵌入芯片的热管理也成为问题。在本文中,已提出了最后芯片嵌入式有源器件,以解决当前芯片优先和中间方法中所报告的一些问题,在这些方法中,在完成包括构造层在内的所有封装衬底工艺之后,才将芯片嵌入,就像传统的SMD包装一样。在后芯片方案中,在封装衬底的堆积层内引入空腔,并且将芯片直接嵌入空腔中。将通过在堆积层内开发各种腔体形成过程,然后将100μmrm $厚的芯片嵌入定义的腔体中,来演示最后一种芯片式嵌入式有源器件的第一个原型。

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