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Investigation of Conductor Packages and Contact Geometries for Stranded Copper Wires

机译:绞合铜线的导体封装和触点几何形状的研究

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摘要

For electrical connections, stranded copper wires are commonly used. Solid wires form one contact resistance between the conductor and the busbar. In contrast, stranded wires additionally give rise to inner cross resistances between the individual strands. The total resistance of stranded wires depends on the shape of the conductor package, which influences the number of vertical and horizontal strands. In this paper, the conductor package of stranded wires is investigated with analytical methods. A model for calculating total resistances is presented. Measurements with different conductor packages are carried out and compared to calculated values. For wide conductor packages, the lowest resistances are found. In addition, the impact of contact geometries is examined; beads with low contact radii tend to show the lowest resistances.
机译:对于电气连接,通常使用多股铜线。实心线在导体和母线之间形成一种接触电阻。相比之下,绞合线另外会引起各个绞合线之间的内部交叉电阻。绞线的总电阻取决于导体封装的形状,这会影响垂直和水平股的数量。本文采用分析方法研究了绞合线的导体封装。提出了用于计算总电阻的模型。进行不同导体封装的测量并将其与计算值进行比较。对于宽导体封装,电阻最低。此外,还检查了接触几何形状的影响。具有低接触半径的磁珠往往显示出最低的电阻。

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