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Storage Life Prediction for a High-Performance Capacitor Using Multi-Phase Wiener Degradation Model

机译:基于多相维纳退化模型的高性能电容器的存储寿命预测

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Capacitance is a critical performance characteristic of high-voltage-pulse capacitor which is used to store and discharge electrical energy rapidly. The capacitors usually are stored for a long period of time before put into use. Experimental result and engineering experience indicate that the capacitance increases with storage time and will eventually exceed the failure threshold, which means that the capacitor may fail during storage. This is a typical mode of degradation failure for long storage products. Further, the capacitance degradation path can be extrapolated in several stages based on the shifting characteristics. That is, the capacitance increases slowly or fluctuates in the initial storage stage that lasts about three months. Then it increases sharply in the middle stage which lasts about four months. After the two stages, the capacitor enters into the third stage in which capacitance increases constantly. This degradation phenomenon motivates us to study the storage life prediction method based on multi-phase degradation path model. The storage performance degradation mechanism of high-voltage-pulse capacitor was investigated, which provides the physical basis for multi-phase Wiener degradation model. Identification procedure for the transition points in the degradation path was proposed using maximum likelihood principle (MLP). The result of Kruskal-Wallis test which is the method to test whether two populations are consistent or not in statistics showed that the transition points are statistically effective. Other parameters in the multi-phase degradation model are estimated with maximum likelihood estimation (MLE) after the transition points have been specified. The multi-phase Inverse Gaussian (IG) distribution for storage life was deduced for the capacitor, and the point and interval estimation procedure for reliable storage life are constructed with bootstrap method. The efficiency and effectiveness of the proposed multi-phase degradation model is compared with storage life prediction under single-phase condition.
机译:电容是高压脉冲电容器的关键性能特征,该电容器用于快速存储和释放电能。电容器在使用前通常要存放很长一段时间。实验结果和工程经验表明,电容随存储时间的增加而增加,并最终超过故障阈值,这意味着电容器在存储期间可能会发生故障。对于长存储产品,这是降级失败的典型模式。此外,可以基于移动特性在几个阶段中推断出电容劣化路径。即,在持续约三个月的初始存储阶段中,电容缓慢增加或波动。然后在持续约四个月的中间阶段急剧增加。经过两个阶段之后,电容器进入第三阶段,在第三阶段中电容不断增加。这种退化现象促使我们研究基于多相退化路径模型的存储寿命预测方法。研究了高压脉冲电容器的存储性能退化机理,为多相维纳退化模型提供了物理基础。使用最大似然原理(MLP)提出了退化路径中过渡点的识别程序。检验统计中两个总体是否一致的方法Kruskal-Wallis检验的结果表明过渡点在统计上是有效的。在指定过渡点后,使用最大似然估计(MLE)估计多相退化模型中的其他参数。推导了电容器的存储寿命多相逆高斯分布,并采用自举法构造了可靠存储寿命的点和区间估计程序。将所提出的多相退化模型的效率和有效性与单相条件下的存储寿命预测进行了比较。

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