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首页> 外文期刊>Clays and clay minerals >LAYER CHARGE DENSITY OF SMECTITES - CLOSING THE GAP BETWEEN THE STRUCTURAL FORMULA METHOD AND THE ALKYL AMMONIUM METHOD
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LAYER CHARGE DENSITY OF SMECTITES - CLOSING THE GAP BETWEEN THE STRUCTURAL FORMULA METHOD AND THE ALKYL AMMONIUM METHOD

机译:蒙脱石的层电荷密度-封闭结构公式法与烷基铵法之间的间隙

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摘要

The layer charge density (LCD) of montmorillonite represents the permanent negative charge, its most important property. The LCD can be determined by two different methods, the structural formula method (SFM) and the alkylammonium method (AAM). Other methods of determining the LCD are calibrated against one or the other of these. The results of the two methods differ systematically: SFM values are larger than AAM values and the difference increases with increasing layer charge density. In the present study, the critical parameters of both methods were considered quantitatively in order to identify the most likely reason for the systematic difference. One particularly important argument against the validity of the SFM is that typical SFM values correspond to unrealistically large CEC values that have never been reported. In addition, SFM does not consider the variable charge which causes cations to be adsorbed to the outer surface (at pH >4). In contrast to minor constituents, which can of course also affect SFM values, the variable charge can explain only part of the systematic difference. The exchange of pure smectite samples with both Cu-trien and alkylammonium revealed the presence of non-exchangeable, non-structural cations (Na, K, Ca). These cations, together with 10% (or more) variable charge, may explain the differences in LCD values. The non-exchangeable, non-structural cations could stem from undetected traces of feldspar or volcanic glass. The present samples indicated that the systematic difference in LCD values between the two methods is related to the amount of non-exchangeable, non-structural cations only, indicating that the two LCD methods probe different features of smectites. Using the SFM on pure smectite provides a value for the total number of charges (permanent with and without fixed (= non-exchangeable, non-structural) cations plus variable charge). The AAM, on the other hand, provides the charge density of the exchangeable cations (without variable charge).
机译:蒙脱土的层电荷密度(LCD)表示永久性负电荷,这是其最重要的特性。 LCD可以通过两种不同的方法确定,结构式方法(SFM)和烷基铵方法(AAM)。确定LCD的其他方法已针对其中一种或另一种进行了校准。两种方法的结果在系统上有所不同:SFM值大于AAM值,并且差异随层电荷密度的增加而增加。在本研究中,两种方法的关键参数均被定量考虑,以找出造成系统差异的最可能原因。反对SFM有效性的一个特别重要的论点是,典型的SFM值对应于从未报道过的不切实际的大CEC值。此外,SFM不考虑会导致阳离子吸附到外表面(pH> 4)的可变电荷。与可能也会影响SFM值的次要成分相反,可变电荷只能解释部分系统差异。纯蒙脱石样品与Cu-trien和烷基铵的交换表明存在不可交换的非结构性阳离子(Na,K,Ca)。这些阳离子与10%(或更多)的可变电荷一起可以解释LCD值的差异。不可交换的非结构性阳离子可能源于未发现的长石或火山玻璃痕迹。本样本表明,两种方法之间LCD值的系统差异仅与不可交换,非结构性阳离子的数量有关,这表明两种LCD方法均探测了蒙脱石的不同特征。在纯蒙脱石上使用SFM可提供总电荷值(带有和不带有固定(=不可交换,非结构性)阳离子加上可变电荷的永久电荷)。另一方面,AAM提供可交换阳离子的电荷密度(无可变电荷)。

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  • 来源
    《Clays and clay minerals 》 |2011年第2期| p.200-211| 共12页
  • 作者单位

    BGR Bundesanstalt fur Geowissenschaften und Rohstoffe, Stilleweg 2, D-30655 Hannover, Germany;

    BGR Bundesanstalt fur Geowissenschaften und Rohstoffe, Stilleweg 2, D-30655 Hannover, Germany,LBEG Landesamt fuer Bergbau, Energie und Geologie, Stilleweg 2, D-30655 Hannover, Germany;

    Department of Natural Resources and Environmental Sciences, University of Illinois, W-321 Turner Hall,1102 South Goodwin Ave, Urbana, IL 61801, USA;

    Department of Natural Resources and Environmental Sciences, University of Illinois, W-321 Turner Hall,1102 South Goodwin Ave, Urbana, IL 61801, USA;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    alkylammonium method; layer charge density; montmorillonite; smectite; structural formula method.;

    机译:烷基铵法层电荷密度;蒙脱石蒙脱石结构公式法。;

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