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首页> 外文期刊>Circuits, Devices & Systems, IET >Experimental and simulation analysis of electrical characteristics of common-source current mirrors implemented with asymmetric self-cascode silicon-on-insulator n-channel metal–oxide–semiconductor field-effect transistors
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Experimental and simulation analysis of electrical characteristics of common-source current mirrors implemented with asymmetric self-cascode silicon-on-insulator n-channel metal–oxide–semiconductor field-effect transistors

机译:非对称自共栅绝缘体上硅n沟道金属氧化物半导体场效应晶体管实现共源电流镜电特性的实验和仿真分析

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摘要

In this paper, the performance of asymmetric self-cascode (A-SC) fully depleted silicon-on-insulator n-channel metal–oxide–semiconductor field-effect transistors configuration applied to common-source current mirrors (CMs) have been analysed through experimental measurements, comparing with symmetric self-cascode configuration as well as with standard uniformly doped transistor. The mirroring precision, output resistance and output swing have been used as figures of merit to evaluate the improvements achieved with the use of A-SC transistors. Two-dimensional numerical simulations have been also performed in order to further explore the advantages of A-SC transistor in common-source CMs. The obtained results have shown that the best mirroring precision has been obtained with larger channel lengths of the transistor near the source. Despite the worsened intrinsic mismatching presented by common-source CMs implemented with A-SC transistors in comparison with single transistor CM, the A-SC structure has allowed larger output resistance, breakdown voltage and better mirroring precision.
机译:在本文中,通过以下方法分析了应用于非共源电流镜(CM)的非对称自共源共栅(A-SC)完全耗尽绝缘体上硅N沟道金属氧化物半导体场效应晶体管的性能实验测量,与对称自共源共栅配置以及标准均匀掺杂晶体管进行比较。镜像精度,输出电阻和输出摆幅已被用作评估A-SC晶体管使用所取得的改进的优值。为了进一步探究A-SC晶体管在共源CM中的优势,还进行了二维数值模拟。所获得的结果表明,在靠近源极处的晶体管的沟道长度较大的情况下,可以获得最佳的镜像精度。尽管与单晶体管CM相比,使用A-SC晶体管实现的共源CM所呈现的内部失配更加严重,但A-SC结构允许更大的输出电阻,击穿电压和更好的镜像精度。

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