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首页> 外文期刊>Circuits and Systems II: Express Briefs, IEEE Transactions on >A 1.5-GS/s Flash ADC With 57.7-dB SFDR and 6.4-Bit ENOB in 90 nm Digital CMOS
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A 1.5-GS/s Flash ADC With 57.7-dB SFDR and 6.4-Bit ENOB in 90 nm Digital CMOS

机译:在90 nm数字CMOS中具有57.7dB SFDR和6.4位ENOB的1.5-GS / s闪存ADC

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摘要

A 7-bit 1.5-GS/s analog-to-digital converter (ADC) incorporates redundancy, reassignment, and digital correction to reduce the complexity of analog functions and the required accuracy compared to traditional Flash ADCs. Deliberate and random mismatch is used to set the desired trip points, achieving a 600-mVpp differential input signal range. The need for a low-impedance high-precision resistor reference ladder is eliminated, and comparator performance is decoupled from matching requirements, so that small and fast dynamic comparators can be used. New analysis discusses the optimum combination of random and deliberate comparator offset to achieve a target effective number of bits (ENOB). This prototype ADC has the highest ENOB and highest sampling frequency of any reported Flash ADC utilizing redundancy. A proof-of-concept prototype achieves no missing codes, 46.6-dB spurious-free dynamic range, and 6.05-bit ENOB at Nyquist input frequency. Fabricated in 90-nm digital CMOS, with a core area of 1.2 $hbox{mm}^{2}$, the device consumes 204 mW from a 1.2-V/0.9-V analog/digital supply.
机译:7位1.5-GS / s模数转换器(ADC)具有冗余,重新分配和数字校正功能,与传统的Flash ADC相比,可以降低模拟功能的复杂性和所需的精度。故意和随机的失配用于设置所需的跳变点,从而实现600 mVpp的差分输入信号范围。消除了对低阻抗高精度电阻器参考阶梯的需求,并且使比较器性能与匹配要求脱节,因此可以使用小型且快速的动态比较器。新的分析讨论了随机和故意比较器偏移的最佳组合,以实现目标有效位数(ENOB)。在所有采用冗余的闪存ADC中,该原型ADC具有最高的ENOB和最高的采样频率。概念验证原型在Nyquist输入频率下不会丢失代码,46.6 dB无杂散动态范围和6.05位ENOB。该器件采用90纳米数字CMOS制造,核心面积为1.2美元/小时,由1.2V / 0.9V模拟/数字电源消耗的功耗为204mW。

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