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首页> 外文期刊>Chinese Journal of Electronics >A Waveguide Gate-Type Complex Detecting Mechanism on Micro-Channel Plate Substrate
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A Waveguide Gate-Type Complex Detecting Mechanism on Micro-Channel Plate Substrate

机译:微通道板基板上的波导门型复合检测机制

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摘要

The waveguide gate-type mechanism on micro-channel plate substrate was firstly put forward for the complex photo detection in Free space optical communication (FSO). Based on the losses of energy coupling between both Micro-channel plates (MCP), we further proposed waveguide gate-type complex detecting mechanism, which was verified in electron optic system by vacuum testing. With the application of the complex detecting mechanism, the device performance has greatly improved, including higher space optical transfer and wider dynamic detecting range.
机译:首先提出了微通道板基板上的波导门型机制,用于自由空间光通信(FSO)中的复杂光检测。基于两个微通道板之间的能量耦合损失,我们进一步提出了波导门型复合检测机制,并通过真空测试在电子光学系统中进行了验证。随着复杂检测机制的应用,设备性能有了很大提高,包括更高的空间光学传输和更宽的动态检测范围。

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