Scanning electrochemical microscopy — development of instrumentation utilizing piezo-bimorph X—Y scanners

摘要

The development of the instrumentation of a scanning electrochemical microscopy (SECM) is presented. The core of the SECM sensing system is constructed based on piezo-bimorph scanners, a mechanical micropositioner of multi-dimensional adjustment and ultramicroelectrodes. The control of the electrochemical cell and the SECM system is realized by a battery powered bipoteniostat and analog control circuits respectively with the control of a microcomputer work station. The demonstrations of SECM experiments are given on both a standard IDA sample and a silver electrode. Discussions on the resolution and quality of SECM image are made.