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首页> 外文期刊>Journal of Electron Spectroscopy and Related Phenomena >Preparation of ZnO thin films using undulator and ArF excimer laser
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Preparation of ZnO thin films using undulator and ArF excimer laser

机译:用起伏器和ArF准分子激光器制备ZnO薄膜

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摘要

We are successful in preparing ZnO thin films from diethylzinc (DEZn) and oxygen gas at very low temperatures using undulator radiation (UR) and ArF excimer laser (EL). The substrate temperature was varied from -150 to 150℃. The composition ratio and carbon content in the films are dependent on the source gas ratio and the substrate temperature. Different behaviors were observed for the irradiation of UR and EL. Carbon— free films with high optical transmission were obtained. Adsorption of precursors on the growing surface is suggested in the growth process.
机译:我们成功地使用波荡辐射(UR)和ArF准分子激光(EL)在非常低的温度下由二乙基锌(DEZn)和氧气制备ZnO薄膜。基板温度在-150至150℃之间变化。膜中的组成比和碳含量取决于原料气体比和基板温度。对于UR和EL的照射观察到不同的行为。获得了具有高光学透射率的无碳膜。建议在生长过程中将前体吸附在生长表面上。

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