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Charge Transfer between Ground-State Si~3+ and He at Electron-Volt Energies

机译:电子伏特能量下,基态Si〜3 +与He之间的电荷转移

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摘要

The charge-transfer rate coefficient for the reaction Si~3+(3s~ 2S) + He →products is measured by means of a combined technique of laser ablation and ion storage. A cylindrical radio-frequency ion trap was used to store Si3+ ions produced by laser ablation of solid silicon targets. The rate coefficient of the reaction was derived from the decay rate of the ion signal. The measured rate coefficient is 6.27_(-0.52_~(+0.68) * 10~-10 cm~3 s~-1 at T_equiv = 3.9 * 10~3 K. This value is about 30/100 higher than the Landau-Zener calculation of Butler & Dalgarno and is larger by about a factor of 3 than the recent full quantal calculation of Honvault et al.
机译:Si〜3 +(3s〜2S)+ He→产物的电荷转移速率系数是通过激光烧蚀和离子存储的组合技术测量的。圆柱形射频离子阱用于存储通过激光烧蚀固体硅靶材产生的Si3 +离子。反应的速率系数是从离子信号的衰减速率得出的。在T_equiv = 3.9 * 10〜3 K时,测得的速率系数为6.27 _(-0.52_〜(+0.68)* 10〜-10 cm〜3 s〜-1。该值比Landau-高约30/100齐纳(Buter&Dalgarno)的齐纳(Zener)计算,比Honvault等人的最新全量化计算大约3倍。

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