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Built-up AFM tips by metal nanoclusters engineering

机译:由金属纳米能器工程建立AFM提示

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摘要

The ability to probe tip-sample interactions by Atomic Force Microscopy (AFM) has recently boosted our understanding of the matter at the atomic scale, enabling the study of properties of surfaces and adsorbates which were previously inaccessible. Nevertheless, this sensitivity to forces presents some drawbacks, as the requirement of a sharp tip apex to prevent the loss of spatial resolution due to the existence of long-range interactions. In this work, we have overcome this long-standing challenge by investigating the controlled extraction of single metallic nanoclusters, selectively grown on graphene. Our results show that the successive extraction of cluster allows to grow nanotips, which minimize the long-range tip-sample interactions and greatly enhance the topographic resolution. We have demonstrated that the created nanotips are very stable, which enables exchanging the sample and using the same nanotip to explore different surfaces without loss of resolution. Since metallic clusters of very different materials and sizes can be grown and selectively extracted by AFM, ours work paves also the way to the specific functionalization of AFM-tips to sense a large variety of interactions.
机译:通过原子力显微镜(AFM)探测尖端样品相互作用的能力最近提高了我们对原子规模对此事的理解,从而能够研究以前无法进入的表面和吸附物的性质。然而,这种对力的敏感性提出了一些缺点,作为尖锐尖端顶点的要求,以防止由于存在远程相互作用的存在而防止空间分辨率的损失。在这项工作中,我们通过研究单一金属纳米能器的控制提取,在石墨烯上选择性地生长来克服这种长期挑战。我们的研究结果表明,连续提取群体允许生长纳米以最小化远程尖端样品相互作用,并大大提高地形分辨率。我们已经证明,所产生的纳米以非常稳定,这使得能够交换样品并使用相同的纳米坡来探索不同的表面而不会损失分辨率。由于可以生长和尺寸的非常不同的材料和尺寸的金属簇,因此我们的工作铺平了AFM-TIPS的特定功能化的方式,以感受到各种各样的相互作用。

著录项

  • 来源
    《Applied Surface Science 》 |2021年第1期| 149325.1-149325.6| 共6页
  • 作者单位

    Univ Autonoma Madrid Dept Fis Mat Condensada E-28049 Madrid Spain;

    Univ Autonoma Madrid Dept Fis Mat Condensada E-28049 Madrid Spain|Univ Autonoma Madrid Inst Nicolas Cabrera E-28049 Madrid Spain|Univ Autonoma Madrid Condensed Matter Phys Ctr IFIMAC E-28049 Madrid Spain;

    Int Iberian Nanotechnol Lab INL P-4715330 Braga Portugal;

    Univ Autonoma Madrid Dept Fis Mat Condensada E-28049 Madrid Spain|Univ Autonoma Madrid Inst Nicolas Cabrera E-28049 Madrid Spain|Univ Autonoma Madrid Condensed Matter Phys Ctr IFIMAC E-28049 Madrid Spain;

    Univ Autonoma Madrid Dept Fis Mat Condensada E-28049 Madrid Spain|Univ Autonoma Madrid Inst Nicolas Cabrera E-28049 Madrid Spain|Univ Autonoma Madrid Condensed Matter Phys Ctr IFIMAC E-28049 Madrid Spain;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    Atomic force microscopy; Tip functionalization; van der Waals force; Nanocluster; Graphene; Atomic resolution;

    机译:原子力显微镜;尖端功能化;van der waals力;纳米光泽;石墨烯;原子分辨率;

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