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Cathodic deposition of CdSe films from dimethyl formamide solution at optimized temperature

机译:在最佳温度下从二甲基甲酰胺溶液中阴极沉积CdSe膜

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摘要

In the present paper, thin film CdSe compound semiconductors have been electroplated on transparent conducting oxide coated glass substrates from nonaqueous dimethyl formamide bath containing CdCl_2, KI and Se under controlled temperature ranging from 100 to 140℃. Thickness of the deposited films as obtained through focussed ion beam technique as well as their microstructural and photoelectrochemical properties have been found to depend on temperature. The film growth was therefore optimized at a bath temperature ~125℃. The formation of crystallites in the range of 100-150 nm size has been ascertained through atomic force microscopy and scanning electron microscopy. Energy dispersive analysis of X-rays for the as deposited film confirmed the 1:1 composition of CdSe compound in the matrix exhibiting band-gap energy of 1.74 eV. Microstructural properties of the deposited films have been determined through X-ray diffraction studies, high-resolution transmission electron microscopy and electron diffraction pattern analysis. Electrochemical impedance spectroscopy and current-potential measurements have been performed to characterize the electrochemical behavior of the semiconductor-electrolyte interface. The photo-activity of the films have been recorded in polysulphide solution under illumination and solar conversion efficiency ≥1% was achieved.
机译:在本文中,已在控制温度100至140℃的条件下,从含有CdCl_2,KI和Se的非水二甲基甲酰胺浴中,在透明导电氧化物涂层的玻璃基板上电镀了CdSe化合物薄膜半导体。已经发现通过聚焦离子束技术获得的沉积膜的厚度及其微结构和光电化学性质取决于温度。因此,在〜125℃的浴温下可以优化膜的生长。已经通过原子力显微镜和扫描电子显微镜确定了在100-150nm尺寸范围内的微晶的形成。 X射线对沉积膜的能量色散分析证实,基质中CdSe化合物的1:1组成显示出1.74 eV的带隙能。已通过X射线衍射研究,高分辨率透射电子显微镜和电子衍射图分析确定了沉积膜的微观结构特性。为了表征半导体-电解质界面的电化学行为,已经进行了电化学阻抗谱和电流电势测量。在光照下在多硫化物溶液中记录了薄膜的光活性,并且太阳能转换效率达到了≥1%。

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