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Influence of surface structure of SiC nano-sized powder analyzed by X-ray photoelectron spectroscopy on basic powder characteristics

机译:X射线光电子能谱分析SiC纳米粉体的表面结构对基本粉体性能的影响

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摘要

SiC nano-sized powder with high specific surface area is potentially of considerable interest to form fully dense SiC ceramics at lower sintering conditions (temperature/pressure). Surface structure of six kinds of commercially available SiC nano-sized powders produced by three different venders was analyzed in detail by X-ray photoelectron spectroscopy (XPS). The overall XPS spectra of all nano-sized powders detected O-based bond (O1s peak), C-based bond (C1s peak) and Si-based bond (Si2s and Si2p peak). Surface structure of nano-sized powders included one of three impurity phases: (1) free carbon, (2) silica and (3) silicon oxycarbide. Furthermore, the influences of surface structure by XPS were systematically investigated on basic powder characteristics, such as chemical composition, morphology, particle density and primary particle size. It was revealed that the basic powder characteristics had a close relationship to the surface structure of nano-sized powder each impurity.
机译:具有较高比表面积的SiC纳米粉末可能会引起人们的极大兴趣,以便在较低的烧结条件(温度/压力)下形成完全致密的SiC陶瓷。通过X射线光电子能谱(XPS)详细分析了由三种不同的供应商生产的六种市售SiC纳米粉末的表面结构。所有纳米尺寸粉末的整体XPS光谱均检测到O基键(O1s峰),C基键(C1s峰)和Si基键(Si2s和Si2p峰)。纳米级粉末的表面结构包括三个杂质相之一:(1)游离碳,(2)二氧化硅和(3)碳氧化硅。此外,系统地研究了XPS的表面结构对基本粉末特性的影响,例如化学成分,形态,颗粒密度和一次粒径。揭示了基本粉末特性与每种杂质的纳米级粉末的表面结构密切相关。

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