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An ab initio-based approach to adsorption-desorption behavior of Si adatoms on GaAs(111)A-(2 × 2) surfaces

机译:基于从头算的方法在GaAs(111)A-(2×2)表面上吸附硅吸附原子

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The adsorption-desorption behavior of Si adatoms on GaAs(111)A-(2 × 2) surfaces is investigated using our ab initio-based approach, in which adsorption and desorption behavior of Si adatoms is described by comparing the calculated desorption energy obtained by total-energy electronic-structure calculations with the chemical potential estimated by quantum statistical mechanics. We find that the Si adsorption at the Ga-vacancy site on the (2 × 2) surfaces with As adatoms occurs less than 1140-1590 K while the adsorption without As adatom does less than 630-900 K. The change in adsorption temperature of Si adatoms by As adatoms is due to self-surfactant effects of As adatoms: the promotion of the Si adsorption triggered by As adatoms is found to be interpreted in terms of the band-energy stabilization. Furthermore, the stable temperature range for Si adsorbed surfaces with As adatoms agrees with the experimental results. The obtained results provide a firm theoretical framework to clarify n-type doping processes during GaAs epitaxial growth.
机译:利用我们的从头算方法研究了GaAs(111)A-(2×2)表面上Si原子的吸附-解吸行为,其中通过比较计算得到的Si原子的解吸能来描述Si原子的吸附和解吸行为。总能量电子结构计算,其中化学势由量子统计力学估算。我们发现,具有As原子的(2×2)表面的Ga空位处的Si吸附小于1140-1590 K,而没有As原子的吸附小于630-900K。 As吸附原子的Si吸附原子归因于As吸附原子的自表面活性剂:发现As吸附原子触发的Si吸附的促进作用是根据能带能量的稳定来解释的。此外,具有砷原子的硅吸附表面的稳定温度范围与实验结果一致。获得的结果提供了一个坚实的理论框架,以阐明GaAs外延生长过程中的n型掺杂过程。

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