Enhancement Of The Secondary Ion Emission Induced By Fast Clusters

摘要

The emission yields of the secondary ions are measured by using a conventional time of flight (TOF) technique under bombardments of Mg and C_2, Ni and Si_2 with different energies, and C_n, Si_n and Ni_n (n = 1-3) with the different charge states and with energy of 1.5 MeV per atom, respectively. For the bombardments of C_n, Si_n and Ni_n, the enhancements of the secondary ion emissions increase with increasing cluster sizes and charge states. For the bombardments of Mg and C_2, Ni and Si_2, although the mass and the nuclear charges of C_2 and Si_2 are the same as or equivalent to Mg or Ni, respectively, the enhancements of the secondary ion emissions induced by the clusters of C_2 and Si_2 in a wide energy range are also clearly indicated. The instantaneous collective interaction of the cluster constituents plays an important role in the secondary ion emissions.