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Photocatalytic characteristics of TiO_2 films deposited by magnetron sputtering on polycarbonate at room temperature

机译:室温下磁控溅射在聚碳酸酯上TiO_2薄膜的光催化特性

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Anatase HO_2 thin films were successfully grown at room temperature on polycarbonate substrates, using RF magnetron sputtering under various conditions. The deposition parameters used to examine the photocatalytic activity of TiO_2 films included RF power, sputtering pressure, argon/oxygen ratio (O_2/( Ar + O_2)) and deposition time. An orthogonal array and analysis of variance (ANOVA) were used to determine the performance of the deposition process. The effects of the deposition parameters on the structure, morphology and photocatalytic performance of TiO_2 films were analyzed using scanning electron microscopy (SEM), X-ray diffraction, a contact angle meter and UV/vis/NIR spectroscopy. The RF power was found to be the factor that most affected the water droplet contact angle and the sputtering pressure was found to be the second ranking factor. The results indicate that the photocatalytic performance is improved by increasing RF power, but an increase in sputtering pressure has an adverse effect. Higher photocatalytic activity is achieved for TiO_2 films using an RF power of 210 W, sputtering pressure of 0.93 Pa, argon/oxygen ratio of 30% and a deposition time of 2 h.
机译:在各种条件下使用RF磁控溅射在室温下成功地在聚碳酸酯基板上生长了锐钛矿型HO_2薄膜。用于检查TiO_2薄膜的光催化活性的沉积参数包括RF功率,溅射压力,氩/氧比(O_2 /(Ar + O_2))和沉积时间。使用正交阵列和方差分析(ANOVA)来确定沉积过程的性能。利用扫描电子显微镜(SEM),X射线衍射,接触角仪和UV / vis / NIR光谱分析了沉积参数对TiO_2薄膜结构,形貌和光催化性能的影响。发现RF功率是最影响水滴接触角的因素,并且发现溅射压力是第二等级因素。结果表明,通过增加RF功率可以改善光催化性能,但是溅射压力的增加具有不利影响。使用210 W的RF功率,0.93 Pa的溅射压力,30%的氩/氧比和2 h的沉积时间,可以获得更高的TiO_2薄膜的光催化活性。

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