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首页> 外文期刊>Applied Surface Science >Direct modification of silicon surface by nanosecond laser interference lithography
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Direct modification of silicon surface by nanosecond laser interference lithography

机译:纳秒激光干涉光刻技术直接修饰硅表面

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摘要

Periodic and quasi-periodic structures on silicon surface have numerous significant applications in pho-toelectronics and surface engineering. A number of technologies have been developed to fabricate the structures in various research fields. In this work, we take the strategy of direct nanosecond laser interference lithography technology, and focus on the silicon material to create different well-defined surface structures based on theoretical analysis of the formation of laser interference patterns. Two, three and four-beam laser interference systems were set up to fabricate the grating, regular triangle and square structures on silicon surfaces, respectively. From the AFM micrographs, the critical features of structures have a dependence on laser fluences. For a relative low laser fluence, grating and dot structures formed with bumps due to the Marangoni Effect. With the increase of laser fluences, melt and evaporation behaviors can be responsible for the laser modification. By properly selecting the process parameters, well-defined grating and dot structures can been achieved. It can be demonstrated that direct laser interference lithography is a facile and efficient technology with the advantage of a single process procedure over macroscale areas for the fabrication of micro and nano structures.
机译:硅表面上的周期性和准周期性结构在光电子学和表面工程中具有许多重要的应用。在各种研究领域中已经开发出许多技术来制造结构。在这项工作中,我们采用直接纳秒激光干涉光刻技术的策略,并基于对激光干涉图案形成的理论分析,着眼于硅材料以创建不同的轮廓分明的表面结构。建立了两个,三个和四个光束的激光干涉系统,分别在硅表面上制造光栅,正三角形和正方形结构。从AFM显微照片可以看出,结构的关键特征与激光通量有关。对于相对较低的激光注量,由于马兰戈尼效应,光栅和点结构形成了凸起。随着激光通量的增加,熔化和蒸发行为可能是激光改性的原因。通过适当选择工艺参数,可以获得定义明确的光栅和点结构。可以证明,直接激光干涉光刻技术是一种简便而有效的技术,它具有在宏观区域上用于制造微米和纳米结构的单一处理程序的优势。

著录项

  • 来源
    《Applied Surface Science》 |2013年第1期|67-72|共6页
  • 作者单位

    JR3CN and CNM (Changchun University of Science and Technology), Changchun 130022, China,JR3CN and IRAC (University of Bedfordshire), Luton LU1 3JU, UK;

    JR3CN and CNM (Changchun University of Science and Technology), Changchun 130022, China,JR3CN and IRAC (University of Bedfordshire), Luton LU1 3JU, UK;

    JR3CN and CNM (Changchun University of Science and Technology), Changchun 130022, China;

    JR3CN and CNM (Changchun University of Science and Technology), Changchun 130022, China,JR3CN and IRAC (University of Bedfordshire), Luton LU1 3JU, UK;

    JR3CN and IRAC (University of Bedfordshire), Luton LU1 3JU, UK;

    JR3CN and CNM (Changchun University of Science and Technology), Changchun 130022, China,JR3CN and IRAC (University of Bedfordshire), Luton LU1 3JU, UK;

  • 收录信息
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    Direct modification; Laser interference lithography; Silicon; Micro and nano structures;

    机译:直接修改;激光干涉光刻;硅;微米和纳米结构;

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