...
首页> 外文期刊>Applied Surface Science >Modification of optical and electrical properties of chemical bath deposited SnS using O_2 plasma treatments
【24h】

Modification of optical and electrical properties of chemical bath deposited SnS using O_2 plasma treatments

机译:使用O_2等离子体处理化学浴沉积的SnS的光电性能

获取原文
获取原文并翻译 | 示例
           

摘要

In this paper, we report modifications of structural and optical, electrical properties that occur in tin sulphide (SnS) treated in O_2 plasma. The SnS thin films were deposited by chemical bath deposition technique. The samples were treated in an O_2 plasma discharge at 3 Torr of pressure discharge, a discharge voltage of 2.5 kV and 20 mA of discharge current. The prepared and treated thin films were characterized by X-ray diffraction, scanning electron microscopy and energy dispersive X-ray analysis. The photoconductivity and electrical effects of SnS have been studied. The SnS thin films had an orthorhombic crystalline structure. With the plasma treatment the optical gap and electrical properties of the SnS films changed from 1.61 to 1.84 eV, for 3.9 × 105 to 10.42 Ω cm, respectively. These changes can be attributed to an increase in electron density, percolation effects due to porosity, surface degradation/etching that is an increase in surface roughness, where some structural changes related to crystallinity occurs like a high grain size as revealed by SEM images.
机译:在本文中,我们报告了在O_2等离子体中处理的硫化锡(SnS)中发生的结构和光学,电学性能的变化。通过化学浴沉积技术沉积SnS薄膜。样品在3 Torr压力放电,2.5 kV放电电压和20 mA放电电流的O_2等离子体放电中进行处理。通过X射线衍射,扫描电子显微镜和能量色散X射线分析对制备和处理的薄膜进行表征。研究了SnS的光电导性和电效应。 SnS薄膜具有正交晶体结构。经过等离子处理后,SnS薄膜的光学间隙和电性能分别从3.9×105到10.42Ωcm从1.61变为1.84 eV。这些变化可归因于电子密度的增加,由于孔隙率引起的渗透作用,表面降解/蚀刻(即表面粗糙度的增加),其中发生了与结晶度有关的一些结构变化,如由SEM图像揭示的高晶粒度。

著录项

  • 来源
    《Applied Surface Science》 |2013年第15期|273-277|共5页
  • 作者单位

    Facultad de Ciencias, Universidad Autonoma del Estado de Mexico, Estado de Mexico, Mexico, Mexico;

    Institute de Ciencias Fisicas, Universidad National Autonoma de Mexico, Apartado Postal 48-3, 62251, Cuernavaca, Morelos, Mexico;

    Centra de Investigation en Energia, Universidad Autonoma del Estado de Mexico, Estado de Mexico, Mexico, Mexico;

    Facultad de Ingenieria Mecanica y Electrica, Universidad Autonoma de Nuevo Leon, Mexico, Mexico;

    Facultad de Ciencias, Universidad Autonoma del Estado de Mexico, Estado de Mexico, Mexico, Mexico;

    Institute de Ciencias Fisicas, Universidad National Autonoma de Mexico, Apartado Postal 48-3, 62251, Cuernavaca, Morelos, Mexico;

  • 收录信息
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    SnS; Thin film; Plasma treatment; Chemical bath deposition;

    机译:SnS;薄膜;等离子治疗;化学浴沉积;

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号