机译:表面活性剂影响的FePt自旋电子薄膜的X射线光电子能谱和正电子an没能谱分析
Department of Materials Physics and Chemistry, University of Science and Technology Beijing, Beijing 100083, People's Republic of China;
Department of Materials Physics and Chemistry, University of Science and Technology Beijing, Beijing 100083, People's Republic of China;
Department of Materials Physics and Chemistry, University of Science and Technology Beijing, Beijing 100083, People's Republic of China;
Department of Materials Physics and Chemistry, University of Science and Technology Beijing, Beijing 100083, People's Republic of China;
Department of Materials Physics and Chemistry, University of Science and Technology Beijing, Beijing 100083, People's Republic of China,The Center for Micromagnetics and Information Technologies (MINT) and Department of Electrical and Computer Engineering, University of Minnesota, 200 Union St SE, Minneapolis, MN 55455, USA;
Department of Materials Physics and Chemistry, University of Science and Technology Beijing, Beijing 100083, People's Republic of China;
Centre for the Physics of Materials and Department of Physics, McGill University, Montreal, Quebec, H3A2T8 Canada;
Key Laboratory of Nuclear Analysis Techniques, Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049, People's Republic of China;
Key Laboratory of Nuclear Analysis Techniques, Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049, People's Republic of China;
Key Laboratory of Nuclear Analysis Techniques, Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049, People's Republic of China;
Department of Materials Physics and Chemistry, University of Science and Technology Beijing, Beijing 100083, People's Republic of China;
Spintronic films; Surfactant; Ordering transition; Defect density;
机译:核反应分析,俄歇电子能谱,X射线光电子能谱和二次离子质谱法研究X-70钢在溶解氢下钝化氧化膜的羟基化
机译:使用X射线光电子能谱和正电子an没研究了通过金属栅沉积将缺陷引入HfO_2栅介质中
机译:弹性反冲检测分析(ERDA),电子能量损失谱(EELS)和X射线光电子能谱(XPS)用于非晶氮化碳膜结构分析的比较研究
机译:用光电子和X射线驻波激发的光电子和X射线发射光谱探测多层旋转型结构(邀请)
机译:以X射线光电子谱(XPS)和光学光谱分析
机译:X射线光电子能谱飞行时间二次离子质谱法和含NHS的有机薄膜的水解再生和反应性的主成分分析
机译:X射线光电子体光谱,拉曼光谱和X射线吸收光谱法分析Sanshu中的Sanshu碳膜。