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Air-stable n-type doping of graphene from overlying Si_3N_4 film

机译:覆盖Si_3N_4膜的石墨烯的空气稳定n型掺杂

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摘要

In this study, we report a facile method to obtain air-stable n-type graphene by plasma-enhanced chemical vapor depositing Si_3N_4 film on the surface of graphene. We have demonstrated that the overlying Si_3N_4 film can not only act as the penetration-barrier against H_2O and O_2 adsorbed on the graphene surface, but also cause an effective n-type doping due to the amine groups at the interface of graphene/Si_3N_4. Furthermore, the studies reveal that the Dirac point of graphene can be modulated by the thickness of Si_3N_4 film, which is due to competing effects of Si_3N_4-induced doping (n-type) and penetrating H_2O (O_2)-induced doping (p-type). We expect this method to be used for obtaining stable n-type graphene field-effect transistors in air, which will be widely used in graphene electronic devices.
机译:在这项研究中,我们报道了一种通过在石墨烯表面上进行等离子体增强化学气相沉积Si_3N_4膜来获得空气稳定的n型石墨烯的简便方法。我们已经证明,上面的Si_3N_4膜不仅可以充当对吸附在石墨烯表面的H_2O和O_2的渗透屏障,而且由于石墨烯/ Si_3N_4的界面上的胺基而引起有效的n型掺杂。此外,研究表明,可以通过Si_3N_4膜的厚度来调节石墨烯的狄拉克点,这是由于Si_3N_4诱导的掺杂(n型)和穿透H_2O(O_2)诱导的掺杂(p型)的竞争效应所致。 )。我们希望该方法可用于在空气中获得稳定的n型石墨烯场效应晶体管,该方法将广泛用于石墨烯电子器件中。

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  • 来源
    《Applied Surface Science》 |2014年第15期|712-715|共4页
  • 作者单位

    State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu 610054, PR China;

    State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu 610054, PR China;

    State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu 610054, PR China;

    State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu 610054, PR China;

    State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu 610054, PR China;

    State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu 610054, PR China;

    State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu 610054, PR China;

    State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu 610054, PR China;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    Plasma-enhanced chemical vapor; deposition; Graphene; Si_3N_4; Dirac point; N-type doping;

    机译:等离子体增强的化学蒸气;沉积石墨烯Si_3N_4;狄拉克点N型掺杂;

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