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Effect of complexing agent TEA: The structural, morphological, topographical and optical properties of Fe_xS_x nano thin films deposited by SILAR technique

机译:络合剂TEA的影响:通过SILAR技术沉积的Fe_xS_x纳米薄膜的结构,形态,形貌和光学性质

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摘要

Iron sulfide thin films (Fe_xS_x) (x = 0.05M, 0.10M, 0.15M, 0.20M and 0.25M) were deposited by SILAR method from equimolar and equivolume aqueous solutions of ferrous nitrate and sodium sulfide with the addition of complexing agent TEA. The structural, morphological and optical characteristics of the films were derived from X-ray diffraction (XRD), scanning electron microscopy (SEM), atomic force microscopy (AFM) and UV-vis spectral techniques. The mixed characteristics (crystalline and amorphous) of the deposited films and the increasing crystalline qualities with the concentrations were understood from the XRD analysis. The grain sizes and roughness of the films were decreases with the increasing concentration and also at the higher concentration films are shown by the same images presence of hexagonal like crystallite structure. The influence of complexing agent TEA on the surface roughness and morphological properties are confirmed by the atomic force microscope (AFM) results. The effect of increasing substrate concentration on the absorption and transmission measurements and its impact on the optical band-gap energy were enumerated from the UV-vis analysis.
机译:通过SILAR方法在硝酸铁和硫化钠的等摩尔和等体积水溶液中加入络合剂TEA,通过SILAR方法沉积硫化铁薄膜(Fe_xS_x)(x = 0.05M,0.10M,0.15M,0.20M和0.25M)。薄膜的结构,形态和光学特性来自X射线衍射(XRD),扫描电子显微镜(SEM),原子力显微镜(AFM)和紫外可见光谱技术。通过X射线衍射分析,可以了解沉积膜的混合特性(晶体和非晶态)以及随着浓度增加的晶体质量。薄膜的晶粒尺寸和粗糙度随着浓度的增加而减小,并且在更高浓度下,通过六边形微晶结构的相同图像显示了薄膜。原子力显微镜(AFM)的结果证实了络合剂TEA对表面粗糙度和形态性能的影响。从紫外可见分析中可以列举出增加底物浓度对吸收和透射测量的影响及其对光学带隙能量的影响。

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