Investigation of rough surfaces on Cu2ZnSn(SxSe1-x)(4) monograin layers using light beam induced current measurements

摘要

Monograin technology has proven to be a successful way of manufacturing low cost photovoltaic applications using the pentanary Cu2ZnSn(SxSe1-x)(4) (CZTSSe) as an absorber material in an industrial roll-to-roll process. For high efficient CZTSSe monograin device fabrication a thorough understanding of the impacts of the device characteristics and surface structure is important. A new evaluation method of Light Beam Induced Current (LBIC) images had to be developed to distinguish between different effects resulting from different surface orientations, grain sizes, packing densities and contacting areas. In this work we will show that with LBIC measurements it is possible to evaluate the quality and differences in produced CZTSSe monograin cells in a post-production and non-destructive step. The high spatial resolution evaluation allows investigating the homogeneity of single crystalline grains as well as certain areas of a CZTSSe device. By introducing a statistical method the active area as a major factor for the current density of a device will be calculated and evaluated. The results show that with LBIC measurements the active area can be quantified, which differs for the investigated cells up to 9%. Additionally, the homogeneity of short circuit current densities of the monograins and also of certain areas of a cell can be detected and quantified. (C) 2017 Elsevier B.V. All rights reserved.