Influence of Buffer Layer Surface Morphology on YBCO Critical Current Density Deposited on NiW Tapes

摘要

YBCO thin films were grown on NiW tapes under continuous moving deposition process. All of YBCO layer, buffer layer, and cap layer were deposited in a compact reel-to-reel pulsed laser deposition system. Since high critical current density is the most important and effective factor to improve performance/price ratio of coated conductor for large scale applications, we focused our research work on enhancing critical current density of YBCO layers on NiW substrates. It was found that superconducting transport properties of YBCO layers were dependent on not only in-plane texture but also surface morphology of buffer layers, especially surface structure and large particles along grain boundary in NiW substrates. High quality YBCO layers with $>4.0times 10^{6} {rm A/cm}^{2}$ (at 77 K, in zero magnetic field) were fabricated on cap layers with nano-scale surface roughness.