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Impurity band in SnBi_4Se_7: thermoelectric power and electrical resistivity measurements

机译:SnBi_4Se_7中的杂质带:热电功率和电阻率测量

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摘要

Thermoelectric power and electrical resistivity measurements on polycrystalline samples of Bi_2Se_3 and sto-ichiometric ternary compound in the quasi-binary system SnSe-Bi_2Se_3 in the temperature range of 90-420 K are presented and explained assuming the existence of an impurity band. The variation of the electron concentration with temperature above 300 K is explained in terms of the thermal activation of a shallow donor, by using a single conduction band model. The density of states effective mass m* = 0.15m_0 of the electrons, the activation energy of the donors, their concentration, and the compensation ratio are estimated. The temperature dependence of the electron mobility in conduction band is analyzed by taking into account the scattering of the charge carriers by acoustic phonon, optical phonon, and polar optical phonon as well as by alloy and ionized impurity modes. On the other hand, by considering the two-band model with electrons in both the conduction and impurity bands, the change in the electrical resistivity with temperature between 420 and 90 K is explained.
机译:在90-420 K的温度范围内,给出并解释了准二元体系SnSe-Bi_2Se_3中Bi_2Se_3的多晶样品和化学计量的三元化合物的热电功率和电阻率,并假设存在杂质带。通过使用单导带模型,根据浅施主的热活化来解释电子浓度随温度高于300 K的变化。估算电子的状态有效质量m * = 0.15m_0的密度,施主的活化能,其浓度和补偿比。通过考虑声子,光子和极性光子以及合金和电离杂质模式对电荷载流子的散射,分析了导带中电子迁移率的温度依赖性。另一方面,通过考虑在导带和杂质带中都具有电子的双带模型,解释了电阻率随温度在420和90 K之间的变化。

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