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Zr-doped SnO_2 thin films synthesized by spray pyrolysis technique for barrier layers in solar cells

机译:喷雾热解技术合成的掺Zr的SnO_2薄膜用于太阳能电池的阻挡层

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摘要

In the present work, we investigated the effect of Zr doping (0-6 at%) on the structural, electrical, and optical properties of tin oxide (SnO_2) thin films deposited onto glass substrates using a spray pyrolysis technique. The room-temperature X-ray diffraction pattern shows that all deposited films exhibit polycrystalline tetragonal structure. The pure SnO_2 film is grown along a preferred (200) direction, whereas Zr-doped SnO_2 (Zr:SnO_2) films started growing along the (220) orientation along with a high intensity peak of (200). Scanning electron microscope (SEM) and atomic force microscope (AFM) images showed that the grains of the films are spherical in structure, and the grain size decreased with increasing of Zr concentration. The optical transmission spectra of deposited films as a function of wavelength confirm that the average optical transmittance is > 85% for Zr:SnO_2 films. The value of the optical bandgap is significantly decreased from 3.94 to 3.68 eV with increasing Zr concentration. Furthermore, the electrical measurements found that the sheet resistance (R_(sh)) and resistivity (ρ) values are decreased with increasing of Zr doping. The lowest values of R_(sh) = 6.82 Ω and ρ = 0.4 × 10~(-3) Ω cm are found in 6-at% Zr-doped SnO_2 film. In addition, a good efficiency value of the figure of merit (Φ=3.35×10~(-3)Ω~(-1)) is observed in 6-at% Zr-doped SnO_2 film. These outstanding properties of Zr-doped SnO_2 films make them useful for several optoelectronic device applications.
机译:在本工作中,我们研究了Zr掺杂(0-6 at%)对使用喷雾热解技术沉积到玻璃基板上的氧化锡(SnO_2)薄膜的结构,电学和光学性质的影响。室温X射线衍射图表明,所有沉积的膜均表现出多晶四方结构。纯SnO_2薄膜沿优选(200)方向生长,而掺Zr的SnO_2(Zr:SnO_2)薄膜开始沿(220)取向生长,并出现(200)高强度峰。扫描电子显微镜(SEM)和原子力显微镜(AFM)图像显示,薄膜的晶粒为球形,并且随着Zr浓度的增加晶粒尺寸减小。沉积膜的光学透射光谱作为波长的函数证实了Zr:SnO_2膜的平均光学透射率> 85%。随着Zr浓度的增加,光学带隙的值从3.94 eV显着降低。此外,电学测量发现,随着Zr掺杂的增加,薄层电阻(R_(sh))和电阻率(ρ)值减小。在含6%原子的Zr掺杂SnO_2薄膜中发现R_(sh)= 6.82Ω和ρ= 0.4×10〜(-3)Ωcm的最小值。另外,在掺杂了6原子%Zr的SnO_2薄膜中,观察到优良的品质因数效率值(Φ= 3.35×10〜(-3)Ω〜(-1))。掺Zr的SnO_2薄膜的这些出色性能使其可用于多种光电器件应用。

著录项

  • 来源
    《Applied Physics 》 |2017年第12期| 761.1-761.7| 共7页
  • 作者单位

    Department of Physics, Madanapalle Institute of Technology and Science, Madanapalle, Andhra Pradesh 517325, India;

    Department of Physics, Indian Institute of Science, Bangalore, Karnataka 560012, India;

    Department of Electronic Engineering, Yeungnam University, 280 Daehak-ro, Gyeongsan-si, Gyeongsangbuk-do 3854, Republic of Korea;

    Department of Electronic Engineering, Yeungnam University, 280 Daehak-ro, Gyeongsan-si, Gyeongsangbuk-do 3854, Republic of Korea;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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