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Field-induced resistive switching of (Ba0.6Sr0.4)TiO3 thin films based on switching of conducting domains model

机译:基于导电畴模型的(Ba0.6Sr0.4)TiO3薄膜的场致电阻转换

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摘要

Field-induced bipolar resistive switching (RS) properties were obtained in both epitaxially and nonepitaxially grown (Ba0.6Sr0.4)TiO3 (BSTO) thin films on Ir electrode. Results inferred that conducting domains were formed during the “forming” process, and the switching of conducting domains led to the RS process. And results showed that epitaxially grown BSTO (E-BSTO) thin film had higher resistance switching ratio than that of non-epitaxially grown BSTO (NE-BSTO) thin film, which was mainly resulted from the Poole-Frenkel emission, more and thinner conducting domains of E-BSTO thin film.
机译:在外延和非外延生长的(Ba 0.6 Sr 0.4 )TiO 3 (BSTO)中均获得了场致双极电阻转换(RS)特性Ir电极上的薄膜。结果推断,在“成型”过程中形成了导电畴,而导电畴的切换导致了RS工序。结果表明,外延生长的BSTO(E-BSTO)薄膜比非外延生长的BSTO(NE-BSTO)薄膜具有更高的电阻切换率,这主要是由于Poole-Frenkel发射,导电性越来越薄所致。 E-BSTO薄膜的领域。

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  • 来源
    《Applied Physics Letters》 |2013年第22期|1-3|共3页
  • 作者

    He Xiliang; Li Xiaomin;

  • 作者单位

    State Key Laboratory of High Performance Ceramics and Superfine Microstructures, Shanghai Institute of Ceramics, Chinese Academy of Sciences, 1295 Ding Xi Road, Shanghai, 200050, People's Republic of China|c|;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
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  • 正文语种 eng
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