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Silicon sub-bandgap photon linear detection in two-photon experiments: A photo-assisted Shockley-Read-Hall mechanism

机译:双光子实验中的硅亚带隙光子线性检测:一种光辅助的Shockley-Read-Hall机制

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摘要

We investigate the linear response of silicon p-i-n diodes to sub-bandgap photons (1.4 μm-1.6 μm) that has been reported by many authors and left unexplored till then. The quantum efficiency of this mechanism is extremely low (typically 10-9) but has a drastic influence on silicon devices harnessing two-photon absorption. We show that this linear photonic current decreases with temperature, displaying an activation energy similar to the dark current one. We show that this behaviour is consistent with a photo-assisted Shockley-Read mechanism in which the occupancy factor of a defect state in the Si band gap is influenced by the sub-band gap photon flux.
机译:我们研究了硅p-i-n二极管对亚带隙光子(1.4?μm-1.6?μm)的线性响应,该响应已被许多作者报道,并且在此之前尚未得到开发。该机制的量子效率极低(通常为10 -9 ),但对利用双光子吸收的硅器件产生了巨大影响。我们表明,这种线性光子电流随温度降低,显示出类似于暗电流的激活能。我们表明,这种行为与光辅助的Shockley-Read机制是一致的,在该机制中,Si带隙中缺陷状态的占有率受子带隙光子通量的影响。

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