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Role of oxygen vacancies in resistive switching in Pt/Nb-doped SrTiO3

机译:氧空位在Pt / Nb掺杂SrTiO 3 的电阻转换中的作用

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摘要

Oxygen vacancies at the metal/oxide interface, driven by an electric field, have been considered responsible for the switching to the low-resistance state. We studied the electrical properties, along with microscopic observations, of the Pt/Nb-doped SrTiO (001) single-crystal system. Electron energy loss spectroscopy revealed highly accumulated oxygen vacancies at the interface in the high-resistance state, contrasting to common explanation. Higher resistance state by more oxygen vacancies was further confirmed in Pt/H-annealed SrTiO. These results suggest the presence of an interfacial state which dominantly determined the resistivity by changing the barrier height at the interface.
机译:在电场作用下,金属/氧化物界面处的氧空位被认为是导致切换到低电阻状态的原因。我们研究了Pt / Nb掺杂SrTiO(001)单晶系统的电学性质以及微观观察结果。与普通的解释相反,电子能量损失谱显示在高电阻状态下界面处高度积累的氧空位。在Pt / H退火的SrTiO中,更多的氧空位导致了更高的电阻状态。这些结果表明存在界面状态,该界面状态通过改变界面处的势垒高度来主要确定电阻率。

著录项

  • 来源
    《Applied Physics Letters》 |2014年第18期|1-4|共4页
  • 作者单位

    Research Institute of Advanced Materials, Department of Material Science and Engineering, Seoul National University, Seoul 151-744, South Korea;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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