High-brightness water-window electron-impact liquid-jet microfocus source

摘要

We demonstrate stable high-brightness operation of an electron-impact water-jet-anode soft x-raynsource. A 30 kV, 7.8 W electron beam is focused onto a 20 u0001m diameter jet resulting innwater-window oxygen line emission at 525 eV/2.36 nm with a brightness of 3.0u0002109nph/ u0001snu0002u0001m2nu0002sru0002lineu0002. Monte Carlo-based modeling shows good quantitative agreement with thenexperiments. The source has potential to increase the x-ray power and brightness by another 1–2norders of magnitude and fluid-dynamical jet instabilities is determined to be the most importantnlimiting factor. The source properties make it an attractive alternative for table-top x-raynmicroscopy. © 2010 American Institute of Physics. u0003doi:10.1063/1.3310281