Electron emission from carbon velvet due to incident xenon ions

摘要

We present measurements of the ion-induced electron emission from carbon velvet. The results from carbon velvet with high aspect ratio vertical fibers (6.8 mu m diameter and 2.6 mm length) show a more than 60% reduction in ion-induced electron emission for normal incident xenon ions over the entire ion incident energy investigated (i.e., 500-2000 eV) when compared to graphite. This is important for plasma-facing surfaces that are exposed to large fluxes of energetic ions, such as beam dumps and chamber walls used to control facility effects in plasma-thruster ground tests. Published by AIP Publishing.