Bragg gratings in silicon-on-insulator waveguides by focused ion beam milling

摘要

We report Bragg grating structures fabricated by focused ion beam milling in optical waveguides, and demonstrate that they can be used as a powerful diagnostic of optical modes in very high index waveguides. We show that higher-order lossy modes, which can be present in large numbers even in single-moded silicon-on-insulator waveguides, can dramatically affect the optical transmission spectra of Bragg gratings in these waveguides, even though these modes are normally not observable. Our results not only illuminate challenges to realize practical gratings in high index waveguides, but raise the possibility of devices based on mode conversion to extremely high order modes.