Atomic resolution on MgO(001) by atomic force microscopy using a double quartz tuning fork sensor at low-temperature and ultrahigh vacuum

摘要

Atomic resolution with a double quartz tuning fork sensor for low-temperature ultrahigh vacuum atomic force and scanning tunneling microscopy is presented. The new features of the force sensor assembly are discussed. Atomically resolved images of MgO on Ag(001) have been obtained. Images acquired in the attractive and the repulsive regimes controlled to a constant frequency shift are shown, revealing contrast changes.