Direct patterning of magnetic media via focusing light by microsphere arrays

摘要

An approach to nanoscale patterning using focused laser beams by two-dimensional lattices of microspheres is presented. The arrays were positioned in a controllable way near the sample surface with submicron accuracy to find the focal plane. This technique has been applied for direct patterning of Fe-Cr layers which exhibit laser-induced modifications in magnetic properties. The obtained data indicate the occurrence of some irregularities in the patterned features. To understand: (1) The reasons for the observed irregularities and (2) how small patterned features can be obtainable, the Mie solution for the intensity of scattered light has been used.