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Effect of anisotropic in-plane strains on phase states and dielectric properties of epitaxial ferroelectric thin films

机译:各向异性面内应变对外延铁电薄膜相态和介电性能的影响

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摘要

A nonlinear thermodynamic theory is used to predict the equilibrium polarization states and dielectric properties of ferroelectric thin films grown on dissimilar substrates which induce anisotropic strains in the film plane. The "misfit strain-temperature" phase diagrams are constructed for single-domain PbTiO_3 and Pb_(0.35)Sr_(0.65)TiO_3 films on orthorhombic substrates. It is shown that the in-plane strain anisotropy may lead to the appearance of new phases which do not form in films grown on cubic substrates. The strain-induced dielectric anisotropy in the film plane is also calculated and compared with the anisotropy observed in Pb_(0.35)Sr_(0.65)TiO_3 films deposited on NdGaO_3.
机译:非线性热力学理论用于预测在不同基板上生长的铁电薄膜的平衡极化态和介电特性,这些薄膜会在薄膜平面内引起各向异性应变。为正交晶系衬底上的单畴PbTiO_3和Pb_(0.35)Sr_(0.65)TiO_3膜构建了“失配应变-温度”相图。结果表明,面内应变各向异性可能导致新相的出现,而新相则不会在立方衬底上生长的薄膜中形成。还计算了薄膜平面中的应变诱导介电各向异性,并将其与在NdGaO_3上沉积的Pb_(0.35)Sr_(0.65)TiO_3薄膜中观察到的各向异性进行了比较。

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