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Extrinsic origin of ferromagnetism in ZnO and Zn_(0.9)Co_(0.1)O magnetic semiconductor films prepared by sol-gel technique

机译:溶胶-凝胶技术制备的ZnO和Zn_(0.9)Co_(0.1)O磁性半导体薄膜中铁磁性的外在起源

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We report on the origin of ferromagnetism in ZnO and Co-doped ZnO magnetic semiconductor films prepared by sol-gel technique on Si(100) and SiO_2 substrates. X-ray diffraction measurements have shown that ZnO and Co-doped ZnO have the expected wurtzite structure and a preferential orientation along the c axis. Optical transmittance measurements revealed that Co is incorporated into the lattice, as Co~(2+) substituting Zn~(2+) ions. Magnetization measurements have shown room-temperature ferromagnetism for both ZnO and ZnO:Co films. After annealing, the magnetization curves recorded on free substrates show the same ferromagnetic behavior as the ZnO:Co film indicating that the ferromagnetism is extrinsic and due to external pollution.
机译:我们报告了在Si(100)和SiO_2衬底上通过溶胶凝胶技术制备的ZnO和Co掺杂ZnO磁性半导体薄膜中铁磁性的起源。 X射线衍射测量表明,ZnO和Co掺杂的ZnO具有预期的纤锌矿结构和沿c轴的优先取向。光学透射率测量表明,Co被掺入晶格中,而Co〜(2+)取代了Zn〜(2+)离子。磁化测量已经显示了ZnO和ZnO:Co薄膜的室温铁磁性。退火后,记录在自由基板上的磁化曲线显示出与ZnO:Co膜相同的铁磁行为,表明铁磁是外在的并且是由于外部污染所致。

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