Electron holography for improved measurement of microfields in nanoelectrode assemblies

摘要

An approach to investigate the electric field distribution and field-emission property of a single crystal tungsten oxide (WO_3) nanowire by electron holography technique is presented, which solves the problems encountered in the traditional reconstruction of the holograms, the so-called perturbed reference wave. We proposed this unique method to meticulously illustrate the status of the surroundings of a single crystal nanowire under biased conditions. This paves the way to precisely quantifying the electric and magnetic field distributions for nanostructures as well as nanodevices.