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Influence of doping density on the normal incident absorption of quantum-dot infrared photodetectors

机译:掺杂密度对量子点红外光电探测器法向入射吸收的影响

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摘要

The influences of doping densities at the quantum-dot (QD) region for 30-period InAs/GaAs quantum-dot infrared photodetectors (QDIPs) are investigated. The InAs/GaAs QDIPs with a lower doping density can operate at high responsivity and high background-limited-performance temperature. Also observed is the decreasing photocurrent ratio of s/p-polarized lights for the QDIPs with increasing QD doping density. Compared to the similar photocurrent ratio of s/p-polarized lights for the GaAs/AlGaAs quantum-well infrared photodetectors at different applied voltages, the observed voltage-dependent response ratio for QDIPs is attributed to the strong scattering characteristics of QDs occupied with photoexcited electrons for electron transport through the QD region.
机译:研究了30周期InAs / GaAs量子点红外光电探测器(QDIP)在量子点(QD)区域掺杂浓度的影响。掺杂密度较低的InAs / GaAs QDIP可以在高响应度和高背景限制性能温度下工作。还观察到随着QD掺杂密度的增加,QDIP的s / p偏振光的光电流比降低。与在不同施加电压下GaAs / AlGaAs量子阱红外光电探测器的s / p偏振光的类似光电流比相比,观察到的QDIP的电压依赖性响应比归因于被光激发电子占据的QD的强散射特性。通过QD区域进行电子传输。

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