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Ferromagnetism in 200-MeV Ag~(+15)-ion-irradiated Co-implanted ZnO thin films

机译:200MeV Ag〜(+15)-离子辐照共注入ZnO薄膜的铁磁性

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Structural, electrical resistivity, and magnetization properties of 200-MeV Ag~(+15)-ion-irradiated Co-implanted ZnO thin films are presented. The structural studies show the presence of Co clusters whose size is found to increase with increase of Co implantation. The implanted films were irradiated with 200-MeV Ag~(+15) ions to fluence of 1 X 10~(12) ions/cm~2. The Co clusters on irradiation dissolve in the ZnO matrix. The electrical resistivity of the irradiated samples is lowered to half. The magnetization hysteresis measurements show ferromagnetic behavior at 300 K, and the coercive field increases with the Co implantation. The ferromagnetism at room temperature is confirmed by magnetic force microscopy measurements. The results are explained on the basis of the close interplay between the electrical and the magnetic properties.
机译:提出了200MeV Ag〜(+15)离子辐照共注入ZnO薄膜的结构,电阻率和磁化性能。结构研究表明,Co团簇的存在随Co注入量的增加而增加。用200MeV的Ag〜(+15)离子辐照注入的膜至注量为1×10〜(12)离子/ cm〜2。辐照下的Co团簇溶解在ZnO基质中。辐射样品的电阻率降低到一半。磁化磁滞测量结果显示在300 K时铁磁行为,并且矫顽场随Co注入而增加。通过磁力显微镜测量确认了室温下的铁磁性。根据电和磁特性之间的紧密相互作用来解释结果。

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