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首页> 外文期刊>Applied Physics Letters >High Q (33 000) all-epitaxial microcavity for quantum dot vertical-cavity surface-emitting lasers and quantum light sources
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High Q (33 000) all-epitaxial microcavity for quantum dot vertical-cavity surface-emitting lasers and quantum light sources

机译:高Q(33 000)全外延微腔,用于量子点垂直腔面发射激光器和量子光源

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摘要

Data are presented on the modal and lasing characteristics of a new type of vertical-cavity surface-emitting laser that uses an intracavity mesa to confine the optical mode, with the mesa also confining the quantum dot active region. The quantum dot active region is lithographically isolated within the intracavity mesa using etching and epitaxial regrowth to form an all-epitaxial microcavity light source. Cavity quality factors as high as 33 000 are measured, and ground state lasing is demonstrated with a single quantum dot active layer for temperatures up to ~ 110 K.
机译:数据介绍了新型垂直腔表面发射激光器的模态和激光特性,该激光器使用腔内台面来限制光学模式,而台面还限制了量子点有源区。使用蚀刻和外延再生长,将量子点有源区光刻隔离在腔内台面内,以形成全外延微腔光源。测量的腔质量因数高达33000,并通过单量子点有源层在高达〜110 K的温度下证明了基态激光发射。

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