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Comparative study of trap densities of states in CdTe/CdS solar cells

机译:CdTe / CdS太阳能电池中态陷阱密度的比较研究

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Density of deep and shallow states has been investigated in three different kinds of CdTe/CdS samples, two of which were grown by metal-organic chemical vapor deposition (MOCVD) and one by close-space sublimation (CSS) methods. The MOCVD samples were p doped by As and grown either with or without a ZnO buffer layer between the transparent conductor and CdS layers. Capacitance-voltage, admittance spectroscopy, and quantum efficiency measurements show pronounced effects of As doping and ZnO incorporation. It is found that A centers and vacancies of Cd, usually observed in CSS devices, are absent in the defect spectra of MOCVD samples.
机译:在三种不同类型的CdTe / CdS样品中,研究了深,浅状态的密度,其中两种是通过金属有机化学气相沉积(MOCVD)生长的,另一种是通过近空间升华(CSS)方法生长的。 MOCVD样品用As进行了p掺杂,并在透明导体和CdS层之间有或没有ZnO缓冲层的情况下生长。电容电压,导纳光谱和量子效率测量结果表明,As掺杂和ZnO的掺入具有明显的影响。发现在MOCVD样品的缺陷谱中通常没有在CSS器件中观察到的C的C中心和空位。

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