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首页> 外文期刊>Applied Physics Letters >Analysis for crystal structure of Bi(Fe,Sc)O_3 thin films and their electrical properties
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Analysis for crystal structure of Bi(Fe,Sc)O_3 thin films and their electrical properties

机译:Bi(Fe,Sc)O_3薄膜的晶体结构及其电学性能分析

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摘要

Thin films of Bi(Fe_(1-x)Sc_x)O_3 (BFSO) system were fabricated on (111)Pt/TiO_2/SiO_2/(100)Si substrates by chemical solution deposition to improve the electrical resistivity by substituting electrically unstable Fe~(3+) cations for stable Sc~(3+) cations. A single phase of perovskite was obtained in the range of x=0-0.30, in which selective replacement of Fe~(3+) and Sc~(3+) was confirmed in x=0-0.15 by using Raman measurement. The leakage current density of the BFSO films was reduced by increasing x. A well-saturated polarization-electric field hysteresis loop was obtained for BFSO films with x=0.15, showing remanent polarization of approximately 35 μC/cm~2.
机译:通过化学溶液沉积在(111)Pt / TiO_2 / SiO_2 /(100)Si衬底上制备Bi(Fe_(1-x)Sc_x)O_3(BFSO)系统的薄膜,以代替电不稳定的Fe〜来提高电阻率。 (3+)阳离子可生成稳定的Sc〜(3+)阳离子。在x = 0-0.30的范围内获得了钙钛矿的单相,其中通过使用拉曼测量在x = 0-0.15中确定了Fe〜(3+)和Sc〜(3+)的选择性取代。 BFSO薄膜的漏电流密度通过增加x来降低。对于x = 0.15的BFSO薄膜,获得了一个饱和的极化电场滞后回路,其剩余极化约为35μC/ cm〜2。

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