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Temperature evolution of the structural properties of monodomain ferroelectric thin film

机译:单畴铁电薄膜结构性能的温度演化

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The structural evolution of epitaxial monodomain (only 180° domains) ferroelectric PbTiO_3 thin film has been investigated, using high-resolution, temperature-dependent, x-ray diffraction. The full set of lattice parameters was obtained from room temperature up to 850 K. It allowed the calculation of the different strains stored in the film at room temperature, underlying the difference between the mechanical strain and the misfit strain. The evolution of the misfit strain as a function of temperature was also calculated and was found to be consistent with the theoretical temperature-misfit strain phase diagram. These data strongly suggest that the film remains ferroelectric and tetragonal up to 940 K.
机译:利用高分辨率,依赖温度的X射线衍射研究了外延单畴(仅180°畴)铁电PbTiO_3薄膜的结构演变。全套晶格参数是从室温(最高850 K)获得的。它可以计算室温下薄膜中存储的不同应变,这是机械应变和失配应变之间差异的基础。还计算了失配应变随温度的变化,发现与理论温度失配应变相图一致。这些数据强烈表明该膜在940 K以下仍保持铁电和四边形。

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