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首页> 外文期刊>Applied Physicsletters >Reduced Boron Lateral Ion Channeling In Very Short P-channel Transistors By Switching From 〈110〉 To 〈100〉 Channel Orientation
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Reduced Boron Lateral Ion Channeling In Very Short P-channel Transistors By Switching From 〈110〉 To 〈100〉 Channel Orientation

机译:从〈110〉切换到〈100〉的沟道方向,减少了非常短的P沟道晶体管中的硼横向离子沟道

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摘要

The on-current of p-channel transistors fabricated on (100) Si substrate can be easily increased by switching from 〈110〉 to 〈100〉 channel orientation because of faster hole transport. In this paper, we pointed out that there is also a reduction in the gate-to-source/drain overlap, resulting in an increase in the effective channel length for p-channel transistors. Our experimental observation can be explained by a reduction in boron lateral ion channeling due to this switch.
机译:通过从〈110〉切换到〈100〉沟道方向,可以更快地增加在(100)Si衬底上制造的p沟道晶体管的导通电流,这是因为其空穴传输速度更快。在本文中,我们指出栅-源/漏重叠也有所减少,从而导致p沟道晶体管的有效沟道长度增加。我们的实验观察结果可以解释为,由于这种转换,硼侧向离子通道的减少。

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