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Thickness dependence of space charge limited current and injection limited current in organic molecular semiconductors

机译:有机分子半导体中空间电荷限制电流和注入限制电流的厚度依赖性

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摘要

We report the experimental investigations on space charge limited current (SCLC) and injection limited current (ILC) in copper phthalocyanine (CuPc), sandwiched between two metal electrodes. Thickness dependence of current-voltage characteristics of SCLC and ILC is accurately reproduced by the electric field and temperature dependent charge carrier mobility, without invoking charge density dependent mobility. These results are interpreted using a consistent description of SCLC and ILC, based on a unified model of hopping transport within Gaussian density of states in CuPc.
机译:我们报告了夹在两个金属电极之间的铜酞菁(CuPc)中的空间电荷限制电流(SCLC)和注入限制电流(ILC)的实验研究。 SCLC和ILC电流-电压特性的厚度依赖性可以通过电场和温度相关的载流子迁移率准确地再现,而无需调用电荷密度相关的迁移率。基于对CuPc中状态的高斯密度内跳跃传输的统一模型,使用SCLC和ILC的一致描述来解释这些结果。

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