Atomic force microscopy measurement of the Young's modulus and hardness of single LaB_6 nanowires

Han Zhang; Jie Tang; Lin Zhang; Bai An; Lu-Chang Qin

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Atomic force microscopy measurement of the Young's modulus and hardness of single LaB_6 nanowires

机译：原子力显微镜测量单根LaB_6纳米线的杨氏模量和硬度

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We have employed the atomic force microscopy based (a) three-point bending and (b) nanoindentation methods to obtain the Young's modulus and hardness of single LaB_6 nanowires. The Young's modulus, E=467.1±15.8 GPa, is the same as that of the LaB_6 single

机译：我们已经采用了基于原子力显微镜的（a）三点弯曲和（b）纳米压痕方法来获得单根LaB_6纳米线的杨氏模量和硬度。杨氏模量E = 467.1±15.8 GPa，与LaB_6单晶的杨氏模量相同

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《Applied Physicsletters》 |2008年第17期|226-228|共3页
作者
Han Zhang; Jie Tang; Lin Zhang; Bai An; Lu-Chang Qin;
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收录信息美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
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正文语种 eng
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Atomic force microscopy measurement of the Young's modulus and hardness of single LaB_6 nanowires

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