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Substrate-induced strain effect in La_(0.875)Ba_(0.125)MnO_3 thin films grown on ferroelectric single-crystal substrates

机译:铁电单晶衬底上生长的La_(0.875)Ba_(0.125)MnO_3薄膜中的衬底诱导应变效应

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摘要

The authors have studied the substrate-induced strain effect in La_(0.875)Ba_(0.125)MnO_3 (LBMO) thin films grown on ferroelectric 0.67Pb(Mg_(1/3)Nb_(2/3))O_3-0.33PbTiO_3 (PMN-PT) single-crystal substrates. Both the strain and resistance of the films can be in situ varied by applying an electric field across the PMN-PT substrates. X-ray diffraction analysis indicates that the variations of strain and resistance result from the induced strain in the PMN-PT substrate due to the ferroelectric polarization or the converse piezoelectric effect. The relationships between the resistance and the induced strain in the LBMO film and PMN-PT substrate have been quantitatively analyzed.
机译:作者研究了在铁电0.67Pb(Mg_(1/3)Nb_(2/3))O_3-0.33PbTiO_3(PMN)上生长的La_(0.875)Ba_(0.125)MnO_3(LBMO)薄膜中的衬底诱导应变效应-PT)单晶衬底。可以通过在PMN-PT基板上施加电场来原位改变薄膜的应变和电阻。 X射线衍射分析表明,应变和电阻的变化是由于铁电极化或逆压电效应引起的PMN-PT基板中感应应变的结果。已经定量分析了LBMO膜和PMN-PT衬底中的电阻和感应应变之间的关系。

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